X-ray Techniques

The laboratory is working within the Consortium for multidisciplinary research of materials MULTIDISC founded by several institutes of SAS. It is equipped with highly flexible diffractometer enabling to perform various types of X-ray diffraction analysis and reflectivity measurements of thin films with thicknesses ranging from micrometers down to a few nanometers.


Diffractometer Bruker D8 DISCOVER equipped with

  • Rotating Cu anode operating at 12 kW (max. 18 kW)
  • Goebel mirror providing parallel beam with a divergence of ~03°
  • Central Eulerian cradle, motorized sample stage with X, Y, Z shifts
  • 4-bounce Bartels monochromator with two Ge 022 channel-cuts and 3-bounce Ge 022 analyzer crystal
  • Knife edge collimator for reflectivity measurement


  • Standard θ/2θ and Grazing incidence X-ray diffraction
  • Texture and stress analysis
  • High resolution X-ray diffraction and reciprocal space mapping
  • Quantitative phase analysis, determination of crystallite size and strain
  • X-ray reflectivity and diffuse scattering

Contact: doc. RNDr. E. Dobročka, PhD., Tel.: +421-2-5479 2507

Access: Individual access

Price: 20 €/hour for SAS employees (running costs)


Diffractometer Bruker D8 DISCOVER