2000

Araujo-Moreira, F., Florencio, O., Navau, C., Pardo, E., Sanchez, A., : AC and DC magnetization of finite cylindrical and orthorhombic superconductors Physica C 341 (2000) 2055-2056.(not IEE SAS).

Attolini, G., Bocchi, C., Germini, F., Pelosi, C., Parisini, A., Tarricone, L., Kúdela, R., Hasenöhrl, S., : Effects of inhomogeneities and ordering in InGaP/GaAs system grown by MOVPE Materials Chemistry & Physics 66 (2000) 246-252.

Beňačka, Š., Štrbik, V., Öszi, Z., Darula, M., Kostič, I., Karlovsky, K., : Resistance anomaly near superconducting-normal metal interface Acta Physica Slovaca 50 (2000) 397-402.

Betko, J., Morvic, M., : Indication of mixed conductivity in III-V semiconductors using conductivity, Hall effect and magnetoresistance measurements Physica Status Solidi A 181 (2000) 169-175.

Boháček, P., Morvic, M., Betko, J., Dubecký, F., Huran, J., : Study of semi-insulating GaAs irradiated with neutrons using conductivity, Hall effect, and magnetoresistance measurement. In: APCOM 2000. Eds. J.Mudroň et al. Liptovský Mikuláš: Military Academy 2000. P. 129.

Bochníček, Z., Vávra, I., : Interdiffusion in amorphous Nb/Si multilayers. Materials Lett. 45 (2000) 120-124.

Bydžovský, J., Kollár, M., Švec, P., Jančárik, V., Vávra, I., : Magnetoelastic strain-meter, elimination of DC magnetic field influence. In: Magnetic Measurement 2000. Praha: 2000. P. 5-8.

Cambel, V., Karapetrov, G., Eliáš, P., Hasenöhrl, S., Kwok, W., Krause, J., Maňka, J., : Approaching the pT range with a 2DEG InGaAs/InP Hall sensor at 77 K. Microelectr. Engn. 51-52 (2000) 333-342.

Cesnak, L., Kováč, P., Gömöry, F., : Current and voltage distribution in composite superconductors with resistive barriers – symmetric case. Supercond. Sci Technol. 13 (2000) 1450-1460.

Cesnak, L., Kováč, P., Gömöry, F., : Current and voltage distribution in composite superconductors with resistive barriers – asymmetric case. Supercond. Sci Technol. 13 (2000) 1461-1466.

Dennis, T., Hulman, M., Kuzmany, H., Shinohara, H., : Vibrational infrared spectra of the two major isomers of [84]fullerene:  C84{D2(IV)} and C84{D2d(II)}. J. Phys. Chem. B 104 (2000) 5411–5413. (Not IEE SAS).

Dubecký, F., Darmo, J., Krempasky, M., Sekáčová, M., Zaťko, B., Boháček, P., Bešše, I., Ruček, M., Nečas, V., Pelfer, P., Senderák, R., Pinčík, E., Somora, M., Kolesár, F., Hudek, P., Kostič, I., : Technology and performance of x-and γ-ray 32 pixel line detector based on semi-insulating GaAs, J. Electrical Engn. 51 (2000) 30-35.

Dubecký, F., Huran, J., Darmo, J., Zaťko, B., Krempasky, M., Boháček, P., Sekáčová, M., Bešše, I., Nečas, V., Hotový, I., Fornari, R., Gombia, E., Pelfer, P., : Performance of radiation detectors based on semiinsulating GaAs and InP. In: Sensors Microsystems. Singapore: World Sci 2000. P. 437-441.

Dubecký, F., Darmo, J., Zaťko, B., Fornari, R., Nečas, V., Krempasky, M., Pelfer, P., Sekáčová, M., Boháček, P., : X-ray and gamma-ray detectors based on bulk semi-insulating GaAs&InP: Present status and prospects. In: SIMC-XI. Eds. C.Jagadish and N.J. Welham. Piscataway: IEEE 2000. P. 151-158.

Dubecký, F., Zaťko, B., Darmo, J., Sekáčová, M., Krempasky, M., Nečas, V., Hlaváč, S., Ruček, M., Senderák, R., Szentpali, B., : On spectrometric performance of GaAs based radiation detectors. In: ASDAM 2000. Eds. J.Osvald et al. Piscataway: IEEE 2000. ISBN 0-7803-5939-9. P. 475-478.

Dubecký, F., Zaťko, B., Darmo, J., Sekáčová, M., Nečas, V., Förster, A., Kordoš, P., : Radiation detector based on bulk semi-insulating GaAs: Role of detector geometry abnd electrode technology. In: SIMC-XI. Eds. C.Jagadish and N.J. Welham. Piscataway: IEEE 2000. P. 187-190.

Eliáš, P., Hasenöhrl, S., Cambel, V., Kostič, I., : Crystallographic dependence of OMVPE InGaAs/InP lateral growth on patterned (100) InP substrates prepared by wet etching. Thin Solid Films 380 (2000) 105-107.

Fabbricatore, P., Farinon, S., Innocenti, S., Gömöry, F., : Magnetic flux shielding in superconducting strip arrays. Phys. Rev. B 61 (2000) 6413-6421.

Fabbricatore, P., Farinon, S., Gömöry, F., Innocenti, S., : Ac losses in multifilamentary high-TC tapes due to a perpendicular ac magnetic field. Supercond. Sci Technol. 13 (2000) 1327-1337.

Fröhlich, K., Vávra, I., Gömöry, F., Šouc, J., Bydžovský, J., Kováč, P., Dobrovodský, J., Marysko, M., : Microstructure-dependent magnetoresistance in La1−xMnO3 thin films. J. Magnetism Magnetic Mater. 211 (2000) 67-72.

Gömöry, F., Šouc, J., Laudis, A., Kováč, P., Hušek, I., : Experimental study of the effect of filament orientation on transport and magnetic ac loss in Bi-2223/Ag multifilamentary tapes. Supercond. Sci Technol. 13 (2000) 1580-1586.

Gömöry, F., Mele, R., Redaelli, S., : AC losses in HTS multilayer cable conductor IoP Conf. Ser. No. 167 (2000) 871-874.

Gömöry, F., : Transport AC losses in a coaxial cylindrical cable IoP Conf. Ser. No. 167 (2000) 1131-1134.

Gömöry, F., Strýček, F., Seiler, E., Hušek, I., Kováč, P., Takács, S., Fabbricatore, P., Farinon, S., Innocenti, S., : Critical current densities and magnetic losses in Bi-2223 tapes determined from experiments in perpendicular AC magnetic field IoP Conf. Ser. No. 167 (2000) 715-718.

Gömöry, F., Hušek, I., Kováč, P., Kopera, Ľ., : AC susceptibility, critical densities and AC losses of Bi-2223/Ag tapes in perpendicular AC magnetic field. In: Studies in High-Temperature Phys. Vol. 32. Ed. A.Narlikar. New York: Nova Sci. Publ. 2000. P. 63.

Haščík, Š., Hrkút, P., Kostič, I., Konečníková, A., : Dry etching of carbon layers in various etch gases. Vacuum 58 (2000) 434-439.

Hotový, I., Huran, J., Spiess, L., Čapkovic, R., Haščík, Š., : Preparation and characterization of NiO thin films for gas sensor applications. Vacuum 58 (2000) 300-307.

Hotový, I., Huran, J., Spiess, L., Siciliano, P., Rella, R., Řeháček, V., : Physical and structural characterization of NiO thin films for gas detection. In: ASDAM 2000. Eds. J.Osvald et al. Piscataway: IEEE 2000. ISBN 0-7803-5939-9. P. 331-334.

Hotový, I., Huran, J., Siciliano, P., Capone, S., Spiess, L., Řeháček, V., : Nickel oxide thin films as gas sensors. In: EUROSENSORS XIV. Copenhagen: MC 2000. P. 163-166.

Hotový, I., Čapkovic, R., Huran, J., Siciliano, P., Rella, R., Spiess, L., : Characterization of NiO thin films for gas sensor. In: Sensors and Microsystems. Singapore: World Sci, 2000. P. 180-185.

Hulman, M., Plank, W., Kurti, J., Kuzmany, H., : Resonance excitation, intertube coupling and distribution of helicities in single-wall carbon nanotubes AIP Conf. Proc. 544 (2000) 271-275. (Not IEE SAS).

Huran, J., Hotový, I., Haščík, Š., Kobzev, A., Balalykin, N., : Investigation of radiation damage in N doped a-SiC : H films annealed by pulsed electron beam. Vacuum 58 (2000) 428-433.

Huran, J., Hotový, I., Kobzev, A., Balalykin, N., Stano, J., Spiess, L., : RBS study of amorphous silicon carbide films annealed by pulse electron beam. In: ASDAM 2000. Eds. J.Osvald et al. Piscataway: IEEE 2000. ISBN 0-7803-5939-9. P. 311-314.

Huran, J., Hotový, I., Kobzev, A., Balalykin, N., : Further studies of N doped a-SiC:H films deposited by PECVD. In: Sensors and Microsystems. Singapore: World Sci, 2000. P. 355-360.

Hušek, I., Kováč, P., : Evaluation of core density during the two-axial rolling of BSCCO/Ag composite. Supercond. Sci Technol. 13 (2000) 385-390.

Chromik, Š., Španková, M., Vávra, I., Gaži, Š., Cannaerts, M., Hellemans, L., Machajdík, D., Beňačka, Š., : CeO2 buffer layers on R-plane Al2O3 Acta Physica Slovaca 50 (2000) 403-410.

Chromik, Š., Jergel, M., Hanic, F., Jimenez, C., Jergel, M., Štrbik, V., Falcony, C., Beňačka, Š., Cheang-Wong, J., Andrade, E., : Preparation and properties of precursor Ba–Ca–Cu–(O, F) thin films deposited from fluorides for superconducting Tl- and Hg-based films. Thin Solid Films 373 (2000) 129-133.

Inakuma, M., Yamamoto, E., Kai, T., Wang, C., Tomiyama, T., Shinohara, H., Dennis, T., Hulman, M., Krause, M., Kuzmany, H., : Structural and electronic properties of isomers of Sc2@C84(I, II, III): 13C NMR and IR/raman spectroscopic studies. J. Phys. Chem. B 104 (2000) 5072–5077. (Not IEE SAS).

Kálna, K., Cheung, C., Pierce, I., Shore, K., : Self-consistent analysis of carrier-transport and carrier-capture dynamics in quantum cascade intersubband semiconductor lasers. IEEE Trans. Microwave Theory Techn. 48 (2000) 639.

Karapetrov, G., Cambel, V., Kwok, W., Crabtree, G., Zheng, H., Veal, B., : Contactless characterization of melt-textured superconducting junctions using micro-Hall sensor arrays. Physica B 284-288 (2000) 2065-2066.

Kasztler, A., Polák, M., Foitl, M., Kirchmayr, H., : Detection of pores and cracks in multifilamentary Bi-2223/Ag tapes IOP Conf. Ser. 167 (2000) 519-522.

Kordoš, P., Javorka, P., Morvic, M., Betko, J., Van Hove, J., Wowchak, A., Chow, P., : Conductivity and Hall-effect in highly resistive GaN layers. Applied Phys. Lett. 76 (2000) 3762-3764.

Kordoš, P., Morvic, M., Betko, J., Van Hove, J., Wowchak, A., Chow, P., : Conductivity and Hall effect characterization of highly resistive molecular-beam epitaxial GaN layers. J. Applied Phys. 88 (2000) 5821-5826.

Korytár, D., Ferrari, C., Surma, B., Strzelecka, S., Dubecký, F., Huran, J., Fornari, R., Pekárek, L., Procházková, O., Šmatko, V., Hruban, A., : On physical parameters and crystal defects of bulk semi-insulating InP for radiation detector fabrication. In: SIMC-XI. Eds. C.Jagadish and N.J. Welham. Piscataway: IEEE 2000. P. 183-186.

Korytár, D., Boháček, P., Ferrari, C., : X-ray flat diffractor optics I. Czechoslovak J. Phys. 50 (2000) 841-849.

Kováč, P., Hušek, I., Gömöry, F., Oduleye, O., Pachla, W., Diduszko, R., McN Alford, N., : Electrical and mechanical properties of Bi-2223/Ag/barrier/Ag composite tapes. Supercond. Sci Technol. 13 (2000) 378-384.

Kováč, P., Hušek, I., Kopera, Ľ., : Advanced rolling techniques for Bi(2223)/Ag wires and tapes IoP Conf. Ser. No. 167 (2000) 455-458.

Kováč, P., Cambel, V., Kopera, Ľ., Melišek, T., Pitel, J., Bukva, P., : Quality measurement of Bi(2223)/Ag tapes by Hall probe array IoP Conf. Ser. No. 167 (2000) 531-534.

Kováč, P., Hušek, I., Gömöry, F., Cesnak, L., Melišek, T., Pachla, W., : Some aspects of Bi(2223)/Ag tapes with resistive barriers IoP Conf. Ser. No. 167 (2000) 527-530.

Kováč, P., Melišek, T., Kasztler, A., Pachla, W., Diduszko, R., Pitel, J., Kirchmayr, H., : Transport current and texture of Bi-2223 grains in multicore Ag sheathed tapes IoP Conf. Ser. No. 167 (2000) 535-538.

Krause, M., Hulman, M., Kuzmany, H., Georgi, P., Dunsch, L., Inakuma, M., Dennis, T., Shinohara, H., : Bonding and dynamics of diatomic metal encapsulates in carbon cages AIP Conf. Proc. 544 (2000) 150-154. (Not IEE SAS).

Krause, M., Hulman, M., Kuzmany, H., Kuran, P., Dunsch, L., Dennis, T., Inakuma, M., Shinohara, H., : Low-energy vibrations in Sc2@C84 and Tm@C82 metallofullerenes with different carbon cages☆. J. Molecular Struct. 521 (2000) 325–340. (Not IEE SAS).

Krempasky, L., Schmidt, C., : Time constant measurement (decay of coupling currents) in high Tc tapes. IEEE Trans. Applied Supercond. 10 (2000) 1251-1254.

Kromka, A., Dúbravcová, V., Cambel, V., : Atomic force microscopy investigation of diamond thin film. In: APCOM 2000. Liptovský Mikuláš: Military Academy 2000. P. 25-28.

Kúdela, R., Kučera, M., Olejníková, B., Eliáš, P., Hasenöhrl, S., Novák, J., : Formation of interfaces in InGaP/GaAs/InGaP quantum wells. J. Crystal Growth 212 (2000) 21-28.

Kúdela, R., Morvic, M., Kučera, M., Kicin, S., Novák, J., : Electrical properties of 2DEG in the GaAs/InGaP based structures. In: ASDAM 2000. Eds. J.Osvald et al. Piscataway: IEEE 2000. ISBN 0-7803-5939-9. P. 223-226.

Kuzmany, H., Hulman, M., Plank, W., : Carbon nanostructure characterization by optics and resonance raman scattering Front. Nano-Optoelectr. Systems 6 (2000) 243-258. (Not IEE SAS).

Kuzmík, J., : β-SiC growth on Si by reactive-ion molecular beam epitaxy Acta Physica Slovaca 50 (2000) 545-548.

Kvitkovič, J., Polák, M., : Magnetic field of bent BSCCO tapes carrying magnetisation currents Inst. of Physics Conf. Ser. 167 (2000) 523-526.

Lalinský, T., Burian, E., Držík, M., Haščík, Š., Mozolová, Ž., Kuzmík, J., Hatzopoulos, Z., : Performance of GaAs micromachined microactuator. Sensors Actuators A 85 (2000) 365-370.

Lalinský, T., Burian, E., Držík, M., Haščík, Š., Mozolová, Ž., Kuzmík, J., : Thermal actuation of a GaAs cantilever beam J. Micromechanics Microengn. 10 (2000) 293-298.

Lalinský, T., Hrkút, P., Mozolová, Ž., Kovačik, T., : Poly Si/Ni(Pt) thin film resistance temperature sensors on GaAs. In: ASDAM 2000. Eds. J.Osvald et al. Piscataway: IEEE 2000. ISBN 0-7803-5939-9. P. 395-398.

Lehtonen, J., Paasi, J., Pitel, J., Kováč, P., : Magnetization losses in magnets wound from anisotropic HTS tape conductors. Physica C 336 (2000) 261-270.

Lehtonen, J., Paasi, J., Korpela, A., Pitel, J., Kováč, P., : AC losses in magnets wound of HTS tape conductors In: Advanced in Cryogenic Engn. Ed. U.B.Balachandran. Vol. 46, Part B – ICMC-99 Montreal. New York, Kluwer Acad. 2000, P. 839-846.

Lehtonen, J., Mikkonen, R., Paasi, J., Kováč, P., : Numerical stability analysis for a solenoidal HTS coil IoP Conf. Ser. No. 167 (2000) 227-230.

Majoros, M., Glowacki, B.A., and Campbell, A.M.: Transport ac losses and screening properties of Bi-2223 multifilamentary tapes covered with magnetic materials, Physica C 338 (2000) 251-262.

Majoros, M., Glowacki, B.A., and Campbell, A.M.: Magnetic screening as a possible way to decrease transport AC losses in multifilamentary superconductors — basic theoretical considerations, Physica C 334 (2000) 129-140.

Milnera, M., Kurti, J., Hulman, M., Kuzmany, H., : Periodic resonance excitation and intertube interaction from quasicontinuous distributed helicities in single-wall carbon nanotubes. Phys. Rev. Lett. 84 (2000) 1324–1327. (Not IEE SAS).

Mitas, L., Grossman, J., Štich, I., Tóbik, J., : Silicon clusters of intermediate size: Energetics, dynamics, and thermal effects. Phys. Rev. Lett. 84 (2000) 1479.(not IEE SAS).

Mošková, A., Moško, M., : Phase-shift analysis of two-dimensional carrier-carrier scattering in GaAs and GaN: Comparison with Born and classical approximations. Phys. Rev. B 61 (2000) 3048.

Mudroň, J., Müllerová, J., Csabay, O., Dubecký, F., Euthymiou, P., Harmatha, L., Zardas, E., : Optical properties of Si-, and Zn-, doped epitaxial layers of InP grown by MOCVD on Fe- doped semi-insulating InP substrates. In: ASDAM 2000. Eds. J.Osvald et al. Piscataway: IEEE 2000. ISBN 0-7803-5939-9. P. 80-83.

Novák, J., Kicin, S., Hasenöhrl, S., Vávra, I., Kučera, M., Hudek, P., : InGaP/GaAs/InGaP quantum wires grown on pre-patterned substrates by MOVPE. Microelectr. Engn. 51-52 (2000) 11-17.

Osvald, J., : Response to “Comment on ‘Numerical study of electrical transport in inhomogeneous Schottky diodes’ ” [J. Appl. Phys. 88, 7366 (2000)]. J. Applied Phys. 88 (2000) 7368-7369.

Osvald, J., : Delta-doped layer influence on Schottky diodes parameters. In: ASDAM 2000. Eds. J.Osvald et al. Piscataway: IEEE 2000. ISBN 0-7803-5939-9. P. 391-394.

Pachla, W., Diduszko, R., Kováč, P., Hušek, I., : Distribution of inhomogeneities across the ceramic core in monocore (Bi,Pb)-2223/Ag tapes. Supercond. Sci Technol. 13 (2000) 373-377.

Pachla, W., Kováč, P., Hušek, I., Diduszko, R., : Effect of intermediate treatment on the structure of monocore Bi-2223/Ag tapes made by two-axial and eccentric rolling IoP Conf. Ser. No. 167 (2000) 579-583.

Pachla, W., Kováč, P., Hušek, I., Diduszko, R., Presz, A., : The effect of sintering time on structure and phase composition in monocore (Bi, Pb)2223/Ag tapes. Supercond. Sci Technol. 13 (2000) 1338-1344.

Pelfer, P., Dubecký, F., Fornari, R., Pikna, M., Gombia, E., Zaťko, B., Darmo, J., Krempasky, M., Sekáčová, M., : Semi-insulating InP detectors for solar neutrino experiment. In: ASDAM 2000. Eds. J.Osvald et al. Piscataway: IEEE 2000. ISBN 0-7803-5939-9. P. 99-104.

Pinčík, E., Jergel, M., Gmucová, K., Glesková, H., Kučera, M., Müllerová, J., Brunel, M., Mikula, M., : Low-energy argon ion beam treatment of a-Si:H/Si structure. Applied Surface Sci 166 (2000) 61-66.

Pinčík, E., Jergel, M., Kučera, M., van Swaaijand, R., Ivančo, J., Senderák, R., Zeman, M., Müllerová, J., Brunel, M., : Influence of the plasma pretreatment of GaAs(100) and Si(100) surfaces on the optical and structural properties of Si3N4/GaAs and a-SiGe/Si interfaces. Applied Surface Sci 166 (2000) 72-76.

Pitel, J., Kováč, P., Melišek, T., Kasztler, A., Kirchmayr, H., : Influence of the number of Bi(2223)Ag pancake coils forming a magnet system on its critical current and stored energy IoP Conf. Ser. No. 167 (2000) 1251-1254.

Pitel, J., Kováč, P., Hušek, I., : Estimation of the upper limit of the critical currents of Bi(2223)Ag tapes with various orientation of filaments IoP Conf. Ser. No. 167 (2000) 507-510.

Pitel, J., Kováč, P., Hušek, I., : Calculation of the critical currents of Bi(2223)/Ag tapes and coils with reduced anisotropy in Ic(B) characteristic — effect of different proportional representations of the filaments oriented parallel and perpendicularly to the tape surface. Physica C 330 (2000) 130-140.

Pitel, J., Kováč, P., Melišek, T., Kasztler, A., Kirchmayr, H., : Influence of the winding geometry on the critical currents and magnetic fields of cylindrical coils made of Bi(2223)Ag anisotropic tapes. IEEE Trans. Applied Supercond. 10 (2000) 478-481.

Plecenik, A., Štrbik, V., Chromik, Š., Zuzčák, M., Beňačka, Š., : Interface properties of YBa2Cu3O7-x/I/metal junctions with native and artificial tunnelling barriers. Supercond. Sci Technol. 13 (2000) 1180-1185.

Polák, M., Janšák, L., Kvitkovič, J., Ušák, P., Paasi, J., Lehtonen, J., Daumling, M., Kasztler, A., Kirchmayr, H., : Effect of interturn spacing on ACloss of single layer Bi-2223/Ag coils. IEEE Trans. Applied Supercond. 10 (2000) 673-676.

Polák, M., Janšák, L., : Transport current ac losses and current-voltage curves of multifilamentary Bi-2223/Ag tape with artificial defects. Supercond. Sci Technol. 13 (2000) 1074-1078.

Polák, M., Janšák, L., : Self-field losses and I-V curves of Bi-2223 tape without silver sheath. IOP Conf. Ser. 167 (2000) 911-914.

Quay, R., Moglestue, C., Palankovski, V., Selberherr, S., : A temperature dependent model for the saturation velocity in semiconductor materials. Mater. Sci Semicond. Process. 3 (2000) 149-155. (Not IEE SAS).

Quay, R., Palankovski, V., Reuter, R., Schlechtweg, M., Kellner, W., Selberherr, S., : III/V device optimization by physics-based S-parameter simulation IOP Conf. Ser. 166 (2000) 325-328. (Not IEE SAS).

Ryć, L., Dubecký, F., Surma, B., Dobrzański, L., Hruban, A., Strzelecka, S., Dresner, J., : Performance of GaAs photoconductive detectors fabricated from different starting materials. In: ASDAM 2000. Eds. J.Osvald et al. Piscataway: IEEE 2000. ISBN 0-7803-5939-9. P. 407-410.

Skov-Hansen, P., Han, Z., Flükiger, R., Marti, F., Kováč, P., : Intermediate mechanical deformation processes in the OPIT fabrication of HTS Bi-2223 tapes IoP Conf. Ser. No. 167 (2000) 623-626.

Surma, B., Strzelecka, S., Gladysz, M., Jurkiewicz-Wagner, E., Hruban, A., Dubecký, F., : Photoluminiscence of active native-like shallow acceptor generated during annealing of semi-insulating GaAs. In: SIMC-XI. Eds. C.Jagadish and N.J. Welham. Piscataway: IEEE 2000. P. 191-194.

Španková, M., Vávra, I., Gaži, Š., Machajdík, D., Chromik, Š., Fröhlich, K., Hellemans, L., Beňačka, Š., : Growth and recrystallization of CeO2 thin films deposited on R-plane sapphire by off-axis RF sputtering. J. Crystal Growth 218 (2000) 287-293.

Štich, I., Tóbik, J., Perez, R., Terakura, K., Ke, S., : Tip-surface interactions in noncontact atomic force microscopy on reactive surfaces. Progress Surface Sci 64 (2000) 179-191.(not IEE SAS).

Štrbik, V., Plecenik, A., Chromik, Š., Beňačka, Š., Zuzčák, M., Machajdík, D., Kunc, M., : Properties of the interfaces in the YBa2Cu3Ox/Au and Tl2Ba2CaCu2Oy/Au heterostructures Acta Physica Slovaca 50 (2000) 571-576.

Takács, S., Iwakuma, M., Funaki, K., : Some factors determining the effective resistance between strands in flat cables (or superconducting filaments in tapes). Supercond. Sci Technol. 13 (2000) 405-411.

Takács, S., Gömöry, F., : Flux penetration into the system of superconducting filaments in normal conducting matrix. IoP Conf. Ser. No. 167 (2000) 611-614.

Takács, S., Iwakuma, M., Funaki, K., : The effective resistence between superconducting filaments in tapes. IoP Conf. Ser. No. 167 (2000) 511-514.

Takács, S., : Time constants and coupling losses in superconducting cables and in magnetic systems. IoP Conf. Ser. No. 167 (2000) 851-854.

Takács, S., : Induced currents and AC losses in superconducting cables due to changing fields at the and portions of magnets. IoP Conf. Ser. No. 167 (2000) 1235-1238.

Tebano, R., Melini, A., Gömöry, F., Mele, R., : Transport AC-losses vs. temperature and frequency in Ag-sheated BSCCO-2223 tapes IoP Conf. Ser. No. 167 (2000) 627-630.

Tebano, R., Uglietti, D., Gömöry, F., Mele, R., Gherardi, L., Coletta, G., : A simple HTS-cable model to study the effect of the geometrical arrangement of the tapes on AC losses. IoP Conf. Ser. No. 167 (2000) 739-742.

Vávra, O., Gaži, Š., : Fast digital method of critical current measurement of superconducting tunnel junction. Rev. Sci Instrum. 71 (2000) 4188-4191.

Vávra, I., Bydžovský, J., Švec, P., Dérer, J., Kamberský, V., Frait, Z., Lopušnik, R., Šturc, P., Hilscher, G., : Low-temperature studies of magnetic Fe/FeSi multilayers. Physica B 284-288 (2000) 1241-1242.

Weiss, F., Lindner, J., Senateur, J., Dubourdieu, C., Galindo, V., Audier, M., Abrutis, A., Rosina, M., Fröhlich, K., Haessler, W., Oswald, S., Figueras, A., Santiso, J., : Injection MOCVD: ferroelectric thin films and functional oxide superlattices. Surface Coatings Technol. 133-134 (2000) 191-197.

Zaťko, B., Dubecký, F., Darmo, J., Krempasky, M., Sekáčová, M., Nečas, V., Boháček, P., Ruček, M., : Role of electron technology in performance of radiation detectors based on bulk semi-insulating GaAs. In: APCOM 2000. Liptovský Mikuláš: Military Academy 2000. P. 133-136.

Zaťko, B., Dubecký, F., Darmo, J., Euthymiou, P., Nečas, V., Krempasky, M., Sekáčová, M., Korytár, D., Csabay, O., Harmatha, L., Pelfer, P., : Electrical and detection performance of radiation detector based on bulk semi-insulating InP: Role of detector volume. In: ASDAM 2000. Eds. J.Osvald et al. Piscataway: IEEE 2000. ISBN 0-7803-5939-9. P. 429-432.

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