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Pribusová Slušná, L., Vegso, K., Dobročka, E., Vojteková, T., Nádaždy, P., Halahovets, Y., Sojková, M., Hrdá, J., Precner, M., Šiffalovič, P., Chen, Z., Huang, Y., Ražnjević, S., Zhang, Z., and Hulman, M.: Ordered growth of hexagonal and monoclinic phases of MoTe2 on a sapphire substrate, CrystEngComm 25 (2023) 5706-5713.
1. Liu, H.Y.: ACS Nano 18 (2024) 2708.
Vegso, K., Shaji, A., Sojková, M., Pribusová Slušná, L., Vojteková, T., Hrdá, J., Halahovets, Y., Hulman, M., Jergel, M., Majková, E., Wiesmann, J., and Šiffalovič, P.: A wide-angle X-ray scattering laboratory setup for tracking phase changes of thin films in a chemical vapor deposition chamber, Rev. Sci Instrum. 93 (2022) 113909.
1. Kneschaurek, E.: Rev. Sci Instrum. 94 (2023) 063901.
2. Clough, R.: J. Analyt. Atom. Spectromet. 38 (2023) 2215.
3. Werzer, O.: Nature Rev. Methods Primers 4 (2024) 15.
Shaji, A., Vegso, K., Sojková, M., Hulman, M., Nádaždy, P., Halahovets, Y., Pribusová Slušná, L., Vojteková, T., Hrdá, J., Jergel, M., Majková, E., Wiesmann, J., and Šiffalovič, P.: Stepwise sulfurization of MoO3 to MoS2 thin films studied by real-time X-ray scattering, Applied Surface Sci 606 (2022) 154772.
1. Cabeda, D.S.: Applied Surface Sci 610 (2023) 155488.
2. Somphonsane, R.: Materials 16 (2023) 4817.
3. Shendokar, S.: Micromachines 14 (2023) 1758.
4. Ponnusamy, K.M.: J. Phys. Chem. Solids 182 (2023) 111575.
5. Wen, K.N.: J. Colloid Interface Sci 679 (2023) 890.
Sojková, M., Hrdá, J., Volkov, S., Vegso, K., Shaji, A., Vojteková, T., Pribusová Slušná, L., Gál, N., Dobročka, E., Šiffalovič, P., Roch, T., Gregor, M., and Hulman, M.: Growth of PtSe2 few-layer films on NbN superconducting substrate, Applied Phys. Lett. 119 (2021) 013101.
1. Koczorowski, W.: Mater. Sci Semicond. Process. 167 (2023) 107814.
2. Raczynski, J.: Mater. Sci Engn. B 297 (2023) 116728.
Hrdá, J., Tašková, V., Vojteková, T., Pribusová Slušná, L., Dobročka, E., Píš, I., Bondino, F., Hulman, M., and Sojková, M.: Tuning the charge carrier mobility in few-layer PtSe2 films by Se: Pt ratio, Erratum RSC Adv. 11 (2021) 39245.
1. Li, J.: Adv. Mater. (2022) 2207796.
Hrdá, J., Tašková, V., Vojteková, T., Pribusová Slušná, L., Dobročka, E., Píš, I., Bondino, F., Hulman, M., and Sojková, M.: Tuning the charge carrier mobility in few-layer PtSe2 films by Se: Pt ratio, RSC Adv. 11 (2021) 27292.
1. Ji, J.: ACS Applied Mater. Interfac. 15 (2023) 51319.
Hrdá, J., Tašková, V., Vojteková, T., Pribusová Slušná, L., Dobročka, E., Píš, I., Bondino, F., Hulman, M., and Sojková, M.: Tuning the charge carrier mobility in few-layer PtSe2 films by Se: Pt ratio, Erratum RSC Adv. 11 (2021) 39245. Shaji, A., Vegso, K., Sojková, M., Hulman, M., Nádaždy, V., Hutár, P., Pribusová Slušná, L., Hrdá, J., Bodik, M., Hodas, M., Bernstorff, S., Jergel, M., Majková, E., Schreiber, F., and Šiffalovič, P.: Orientation of few-layer MoS2 films: in-situ x-ray scattering study during sulfurization, J. Phys. Chem. C 125 (2021) 9461–9468.
1. Kim, J.H.: Nano Energy 91 (2022) 106693.
2. Krbal, M.: Applied Phys. Lett.121(2022) 192105.
3. Cabeda, D.S.: Applied Surface Sci 610 (2023) 155488.
4. Lei, H.: ACS Applied Nano Mater. 7 (2024) 3931.
Moravský, L., Michalczuk, B., Hrdá, J., Hamaguchi, S., and Matejčík, Š.: Monitoring of nonthermal plasma degradation of phthalates by ion mobility spectrometry, Plasma Process. Polymers 18 (2021) 2100032. (Not IEE SAS)
1. Liu, Y.D.: Fuel 357 (2024) C129988.
Michalczuk, B., Moravský, L., Hrdá, J., and Matejčík, Š.: Atmospheric Pressure chemical ionisation study of selected volatile organic compounds (VOCs) by ion mobility spectrometry coupled with orthogonal acceleration time of flight mass spectrometry, Inter. J. Mass Spectrometry 449 (2020) 116275. (Not IEE SAS)
1. Perez, R.L.: CHEMOSENSORS 9 (2021) 153.
2. Zhu, J.: Sci Bull. 66 (2021) 1176.
3. He, F.Y.: Talanta 225 (2021) 121847.
4. Chen, C.H.: Analyt. Chimica Acta 1204 (2022) 339699.
5. Zhang, C.: J. Adv. Ceram. 11 (2022) 379.
6. Zhu, J.X..: Nature Comm. 14 (2023) 2524.
7. Zhang, Y.: Sensors Actuators B 399 (2024) 134834.