RNDr. Korytár Dušan, CSc.

Ferrari, C., Beretta, S., Rotunno, E., Korytár, D., and Zápražný, Z.: Compressive strain formation in surface-damaged crystals, J. Applied Crystall. 53 (2020) 629-634.

1. Massa, E.: J. Applied Crystall. 53 (2020) 1195.

Zápražný, Z., Korytár, D., Jergel, M., Halahovets, Y., Kotlár, M., Maťko, I., Hagara, J., Šiffalovič, P., Keckes, J., and Majková, E.: Characterization of the chips generated by the nanomachining of germanium for X-ray crystal optics, Inter. J. Adv. Manufactur. Technol. 102 (2019) 2757-2767.

1. Shahinian, H.: Proc. SPIE 11175 (2019) UNSP 111750E.

Zaťko, B., Hrubčín, L., Šagátová, A., Osvald, J., Boháček, P., Zápražný, Z., Sedlačková, K., Sekáčová, M., Dubecký, F., Skuratov, V.A., Korytár, D., and Nečas, V.: Schottky barrier detectors based on high quality 4H-SIC semiconductor: electrical and detection properties, Applied Surface Sci 461 (2018) 276-280.

1. Zhou, Y.: Carbon 148 (2019) 387.
2. Dong, P.: IEEE Access 7 (2019) 170385.
3. Sarac, Y.: J. Alloys Comp. 824 (2020) 153899.
4. Xie, X.-M.: Trans. Nonferr. Metals Soc China‏ 30 (2020)‏ 3058.

Korytár, D., Zápražný, Z., Ferrari, C., Frigeri, C., Jergel, M., Maťko, I., and Kečkeš, M.: Cross-sectional TEM study of subsurface damage in SPDT machining of germanium optics, Applied Optics 57 (2018) 1940-1943.

#        1. Zhao, L.-D.: Guangzi Xuebao/Acta Photonica Sinica 47 (2018) 0822002.
2. Zhao, Q.: Proc. Inst. Mechan. Eng. Part B-J. Engn. Manufact. 233 (2019) 2251.
3. Xu, J.: Proc. SPIE 11175 (2019) UNSP 1117508.
#      4. Shahinian, H.: Proc. 34th ASPE Ann. Meeting 2019, pp. 319-324.
5. Maksakova, O.V.: J. Alloys Compounds 831 (2020) 154808.
#      6. Geng, R.: Xiyou Jinshu/Chinese J. Rare Metals 44 (2020) 850.

Zaťko, B., Zápražný, Z., Jakůbek, J., Šagátová, A., Boháček, P., Sekáčová, M., Korytár, D., Nečas, V., Žemlička, J., Mora, Y., and Pichotka, M.: Imaging performance of Timepix d etector based on semi-insulating GaAs, J. Instrument. 13 (2018) C01034.

1. Veale, M. C.: J. Phys. D 52 (2019) 085106.
2. Curtis, T.E.: J. Medical Imaging 6 (2019) 013501.

Šiffalovič, P., Végsö, K., Hodas, M., Jergel, Ma., Halahovets, Y., Pelletta, M., Korytár, D., Zápražný, Z., and Majková, E.: In situ x-ray reciprocal space mapping for characterization of nanomaterials. In: X-ray and neutron techniques for nanomaterials characterization. Ed. C. S.S.R. Kumar. Berlin, Springer 2016. ISBN 978-3-662-48604-7. P. 507-544.

1. Nsabimana, A.: Nanopart. Design Character. Catalyt. Appl. Sustain. Chem. 38 (2019) 163.

Végsö, K., Jergel, M., Šiffalovič, P., Majková, E., Korytár, D., Zápražný, Z., Mikulík, P., and Vagovič, P.: Towards high-flux X-ray beam compressing channel-cut monochromators, J. Applied Crystall. 49 (2016) 1885-1892.

1. Shioya, N.: Applied Phys. Express 13 (2020) 095505.

Zápražný, Z., Korytár, D., Jergel, M., Šiffalovič, P., Halahovets, Y., Keckes, J., Matko, I., Ferrari, C., Vagovič, P., and Mikloška, M.:  Nano-machining for advanced x-ray crystal optics, AIP Conf. Proc. 1764 (2016) 020005.

*       1. Goel, B.: Inter. J. Machin. Machinab. Mater. 23 (2021) 160-190.

Hrivňak, S., Uličný, J., Mikeš, L., Cecilia, A., Hamann, E., Baumbach, T., Švéda, L., Zápražný, Z., Korytár, D., Gimenez, E., Wagner, U., Rau, C., Greven, H., Vagovič, P., : Single-distance phase retrieval algorithm for Bragg Magnifier microscope. Optics Express 24 (2016) 27753-27762.

1. Ryu, D.: Biomedical Optics Express 8 (2017) 1981.
2. Lu, H.: Laser Optoelectr. Progress 57 (2020) 140001.

Vagovič, P., Korytár, D., Cecilia, A., Hamann, E., Baumbach, T., and Pelliccia, D.: Laboratory-based multi-modal X-ray microscopy and micro-CT with Bragg magnifiers, Optics Express 23 (2015) 18391-18400.

1. Nalimov, A.G.: Computer Optics 42 (2018) 933.
2. Wen, H.: Sci Rep. 8 (2018) 10978.

Zápražný, Z., Korytár, D., Šiffalovič, P., Jergel, Ma., Demydenko, M., Mikulík, P., Dobročka, E., Ferrari, C., Vagovič, P., and Mikloška, M.: Simulations and surface quality testing of high asymetry angle x-ray crystal monochromators for advanced x-ray imaging applications, Proc. SPIE 9207 (2014)  92070Y.

1. Zhu J.: Acta Phys. Sinica 67 (2018) 036102.

Wachulak, P., Wegrzynski, L., Zápražný, Z., Bartnik, A., Fok, T., Jarocki, R., Kostecki, J., Szczurek, M.,Korytár, D., Fiedorowicz, H., : Extreme ultraviolet tomography of multi-jet gas puff target for high-order harmonic generation. Applied Phys. B 117 (2014) 253-263.

1. Stafe, M.: Univ. Politehn. Bucharest Sci Bull.-Ser. A77 (2015) 187.
2. Kantsyrev, V.L.: High Energy Density Phys.19 (2016) 11.
3. Schultz, K. A.: Phys. Plasmas 23 (2016) 101207.
4. Tchulov, O.: Sci. Rep. 7 (2017) 6814.
5. Comby, A.: Optic Express  26 (2018) 6001.
6. Schultz, K. A.: Laser Particle Beams 37 (2019) 276.

Vagovič, P., Švéda, L., Cecilia, A., Hammann, E., Pelliccia, D., Gimenez, E., Korytár, D., Pavlov, K., Zápražný, Z., Zuber, M., Koenig, T., Olbinado, M., Yashiro, W., Momose, A., Fiederle, M., and Baumbach, T.: X-ray Bragg magnifier microscope as a linear shift invariant imaging system: image formation and phase retrieval, Optics Express 22 (2014) 21508-21520.

1. Hirano, K J. Synchrotron Radiation 22 (2015) 956.
#      2. Rau, C.: Synchrotron Radiation News 30 (2017) 19.
3. Lu, H.: Laser Optoelectr. Progress 57 (2020) 140001.

Jergel, M., Šiffalovič, P., Végsö, K., Majková, E., Korytár, D., Zápražný, Z., Perlich, J., Ziberi, B., Cornejo, M., Vagovič, P., : Extreme x-ray beam compression for a high-resolution table-top grazing-incidence small-angle x-ray scattering setup. J. Applied Crystall. 46 (2013) 1544-1550.

1. Zheng, N.: J. Applied Crystall. 48 (2015) 608.
2. Fewster, P.F.: X-Ray Scattering from Semiconductors and other Materials. World Sci 2015. ISBN-13: 978-9814436922. P. 243.

Ferrari, C., Buffagni, E., Bonnini, E., and Korytár, D.High diffraction efficiency in crystal curved by surface damage, J. Applied Crystall. 46 (2013) 1576-1581.

1. Camattari, R.: J. Applied Crystall. 47 (2014) 1762.
2. Paterno, G.: J. Applied Crystall. 48 (2015) 125.
3. Mazzolari, A.: Nuclear Instrum. Methods in Phys. Res. B 355 (2015) 297.
4. Camattari, R.: J. Applied Crystall. 48 (2015) 943.
5. Camattari, R.: J. Applied Crystall. 48 (2015) 977.
6. Bellucci, V.: Applied Phys. Lett. 107 (2015) 064102.
7. Paterno, G.: J. Applied Crystall. 49 (2016) 468.
8. Camattari, R.: Astronomy & Astrophys. 587 (2016) A21.
9. Camattari, R.: J. Applied Crystall. 50 (2017) 145.
#   10. Kurhekar, A.S.: Proc. ICECS 2017, 8067870, p. 206.
11. Camattari, R.: Experiment. Astron. 46 (2018) 309.
12. Mazzolari, A.: Phys. Rev. Res.‏ 3 (2021) 013108.

Vagovič, P., Korytár, D., Cecilia, A., Hamann, E., Švéda, L., Pelliccia, D., Härtwig, J., Zápražný, Z., Oberta, P., Dolbnya, I., Shawney, K., Fleschig, U., Fiederle, M., Baumbach, T., : High-resolution high-efficiency X-ray imaging system based on the in-line Bragg magnifier and the Medipix detector. J. Synchrotron Radiation 20 (2013) 153-159.

*      1. Kim, S.J.: Progress Medical Phys. 24 (2013) 41.
2. Hirano, K.: Nuclear Instrum. Methods in Phys. Res. A 741 (2014) 78.
3. Hirano, K J. Synchrotron Radiation 22 (2015) 956.
4. Cusatis, C.: J. Applied Crystall. 48 (2015) 876.
5. Hirano, K.: AIP Conf. Proc. 1741 (2016) 040020.
6. Lu, H.: Laser Optoelectr. Progress 57 (2020) 140001.
7. Huang, P.: J. Synchrotron Radiation 28 (2021) ‏ 292.

Korytár, D., Vagovič, P., Végsö, K., Šiffalovič, P., Dobročka, E., Jark, W., Áč, V., Zápražný, Z., Ferrari, C., Cecilia, A., Hamann, E., Mikulík, P., Baumbach, T., Fiederle, M., Jergel, M., : Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging. J. Applied Crystall. 46 (2013) 945-952.

       1. Hirano, T.: Rev. Sci Instrum. 87 (2016) 063118.

Korytár, D., Vagovič, P., Ferrari, C., Šiffalovič, P., Jergel, M., Dobročka, E., Zápražný, Z., Áč, V., Mikulík, P., :Process-induced inhomogeneities in higher asymmetry angle x-ray monochromators. Proc. SPIE 8848 (2013) 8848-28. (ITMS 26220220170)(APVV 0308-11).

     1. Cusatis, C.: J. Applied Crystall. 48 (2015) 876.

Zápražný, Z., Korytár, D., Mikulík, P., Áč, V., : Processing of projections containing phase contrast in laboratory micro-computerized tomography imaging. J. Applied Crystall. 46 (2013) 933-938.

        1. Fatima, A.: J. Synchrotron Radiation 24 (2017) 232.

Zápražný, Z., Korytár, D., Áč, V., Konopka, P., Bielecki, J., : Phase contrast imaging of lightweight objects using microfocus X-ray source and high resolution CCD camera. J. Instrum. 7 (2012) C03005.

1. Sung, Y.: Optics Express 21 (2013) 17547.
2. Sung, Y.: Optics Express 21 (2013) 23671.

Ferrari, C., Germini, F., Korytár, D., Mikulík, P., and Peverini, L.: X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions, , J. Applied Crystall. 44 (2011) 353-358.

1. Frahm, R.: J. Synchrotron Radiat. 26 (2019) 1879.

Vagovič, P., Korytár, D., Mikulík, P., Cecilia, A., Ferrari, C., Yang, Y., Hänschke, D., Hamann, E., Pelliccia, D., Lafford, T., Fiederle, M., Baumbach, T., : In-line Bragg magnifier based on V-shaped germanium crystals. J. Synchrotron Radiation 18 (2011) 753-760.

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2. Hirano, K.: Nuclear Instrum. Methods in Phys. Res. A 741 (2014) 78.
3. Wu, Y.: Japan. J. Applied Phys. 54 (2015) 096701.

Áč, V., Perichta, P., Korytár, D., and Mikulík, P.:  Thermal effects under synchrotron radiation power absorption. In: Modern Developments in X-Ray and Neutron Optics. Series: Springer Series in Optical Sciences, Vol. 137. Eds. Erko, A. et al. Berlin: Springer 2008. ISBN: 978-3-540-74560-0. P. 513-524.

1. Vartanian, V.: J. Micro-Nanolith. MEMS MOEMS 13 (2014) 011206.
2. Oreshko, A.P.: Moscow Univ. Phys. Bull. 75 (2020) 249.

Dubecký, F., Ferrari, C., Korytár, D., Gombia, E., and Nečas, V.: Performance of semi-insulating GaAs-based radiation detectors: Role of key physical parameters of base mnaterials. Nuclear Instr. and Methods in Phys. Res. A 576 (2007) 27-31.

1. Celik, A.: X-Ray Spectrometry 37 (2008) 490.
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*    3. Avenel-Le Guerroue, M.L.: PhD Thesis. Grenoble: CEA – LETI – Direction de la Recherche Technologique 2012.
4. Manifacier, J.C.: Solid-State Electr. 80 (2013) 45.
5. Mouleeswaran, D.: J. Crystal Growth 362 (2013) 238.
6. D’Aillon, E.G.: Nuclear Instrum. Methods in Phys. Res. A 727 (2013) 126.

Ferrari, C., Pernot, P., Mikulík, P., Helfen, L., Verdi, N., Baumbach, T., Lübbert, D., and Korytár, D.Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging, J. Applied Crystallography 38 (2005) 91-96.

1. Yi, J.M.: J. Applied Crystallography 40 (2007) 376.
2. Calamiotou, M.: J. Applied Phys. 102 (2007) art. no. 083527.
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5. Honnicke, M.G.: J. Applied Crystall. 42 (2009) 999.
6. Honnicke, M.G.: J. Electronic Mater. 39 (2010) 727.
*     7. Tasca, K. R.: PhD Thesis. Univ. Federal do Paraná, Curitiba 2010, Paraná.
8. Kluender, R.: Physica Status Solidi A 208 (2011)  2505.
*      9. Kluender, R.: Thesis. Univ. Grenoble 2011.
       10. Tsoutsouva, M.G.: J. Crystal Growth 401 (2014) 397.
11. Tsoutsouva, M.G.: J. Applied Crystall. 48 (2015) 645.
12. Tsoutsouva, M. G.: Acta Materialia 88 (2015) 112.
13. Thu, N.T.T.: Solar Energy Mater. Solar Cells 135 (2015) SI17.
14. Honnicke, M.G.: J. Applied Crystall. 49 (2016) 1443.
15. Stoupin, S.: AIP Conf. Proc. 1741 (2016) 050020.
16. Thu, N.T.T.: J. Applied Crystall. 50 (2017) 561.
17. Kim, J.: CRYSTENGCOMM 20 (2018) 7761.
18. Kim, J.: Applied Phys. Express 11 (2018) 081002.
19. Macrander, A.: J. Applied Crystall. 52 (2019) 115.
20. Kim, J.: CRYSTENGCOMM 21 (2019) 2281.
21. Kim, J.: Phys. Rev. Applied 11 (2019) 024072.
22. Suzuki, R.: J. Applied Crystall. 54 (2021) ‏ 163.
23. Yildirim, C.: J. Synchrotron Radiat. 28 (2021) 301.

Korytár, D., Baumbach, T., Ferrari, C., Helfen, L., Verdi, N., Mikulík, P., Kubena, A., Vagovič, P., : Monolithic two-dimensional beam compressor for hard x-ray beams. J. Phys. D: Appl. Phys. 38 (2005) A208-A212.

*   1. Santin, R. Microscopia de raios x com cristais perfeitos assimétricos. Diploma Work.Curitiba: 2007.

Mikulík, P., Baumbach, T., Korytár, D., Lübbert, D., and Perrot, P.: Micrometer-resolved determination of 3D lattice misorientation for the semiconductor wafers inspection by synchrotron radiation area diffractometry, J. Phys. D 36 (2003) A74-A78. (Not IEE SAS).

1. Macrander, A.T.: Applied Phys. Lett. 87 (2005) 194113.
2. Calamiotou, M.:  J. Applied Phys. 102 (2007) 083527.
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5. An, Y.H.: Inter. J. Engn. Scie 47 (2009) 866.
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8. Kim, J.: Applied Phys. Express 11 (2018) 081002.
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10. Suzuki, R.: J. Applied Crystall. 54 (2021) ‏ 163.
11. Lider, V.V.: Phys. Solid State 63 (2021) 189.

Korytár, D., Mikulík, P., Ferrari, C., Hrdý, J., Baumbach, T., Freund, A., and Kubena, A.: Two-dimensional x-ray magnification based on a monolithic beam conditioner, J. Phys. D 36 (2003) A65-A68.

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3. Szabo, C.I.: Rev. Sci Instrum. 81 (2010) 10E311.

Mikulík, P., Baumbach, T., Korytár, D., Pernot, P., Lübbert, D., Helfen, L., Landesberger, C., : Advanced X-ray diffraction imaging techniques for semiconductor wafer characterisation. Materials Structure 9 (2002) 87-88. (Not IEE SAS).

*    1. Lu, W.: Inter. J. Machining Machinab. Materials 2 (2007) 125.
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Boháček, P., Korytár, D., Ferrari, C., Dubecký, F., Surma, B., Zaťko, B., Šmatko, V., Huran, J., Fornari, R., Sekáčová, M., Strzelecka, S., : Correlation of crystal defects and galvanomagnetic parameters of semi-insulating InP with performance of radiation detectors fabricated from characterised materials. Materials Sci Engn. B 91-92 (2002) 516-520.

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Ferrari, C., Korytár, D., : A monolithic monochromator–collimator for high-resolution X-ray diffraction. J. Applied Crystallography 34 (2001) 608-612.

*     1. Authier, A.: In: Dynamical theory of X-ray diffraction. Oxford: OUP 2004. P. 460.
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3. Lengyel, O.: Advanced Mater. 18 (2006) 896.
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Korytár, D., Hrdý, J., Artemiev, N., Ferrari, C., Freund, A., : Sagittal X-ray beam deviation at asymmetric inclined diffractors. J. Synchrotron Radiation 8 (2001) 1136-1139.

*    1. Hrdá, J.: PhD Thesis. Praha 2007.
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Korytár, D., Boháček, P., Ferrari, C., : X-ray flat diffractor optics II. Czechoslovak J. Phys. 51 (2001) 35-47.

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Korytár, D., Ferrari, C., : X-ray topography in the study of semiconductors. Acta Physica Slovaca 51 (2001) 9-15.

#      1. Zhao, Y.: Chinese J. Semicond. 26 (2005) S52.
2. Kowalski, G.: Acta Physica Polonica A  114 (2008) 391.

Zaťko, B., Dubecký, F., Darmo, J., Euthymiou, P., Nečas, V., Krempasky, M., Sekáčová, M., Korytár, D., Csabay, O., Harmatha, L., Pelfer, P., : Electrical and detection performance of radiation detector based on bulk semi-insulating InP: Role of detector volume. In: ASDAM 2000. Eds. J.Osvald et al. Piscataway: IEEE 2000. ISBN 0-7803-5939-9. P. 429-432.

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Korytár, D., Boháček, P., Ferrari, C., : X-ray flat diffractor optics I. Czechoslovak J. Phys. 50 (2000) 841-849.

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Korytár, D., Ferrari, C., Strzelecka, S., Šatka, A., Darmo, J., Dubecký, F., Hruba, L., : Study of crystal defects in radiation detectors grade semi-insulating GaAs. In: SIMC-X. Eds.: Z.Liliental-Weber and C.Miner. Piscataway: IEEE 1999. P. 331-334.

*     1. Avenel-Le Guerroue, M.L.: PhD Thesis. Grenoble: CEA – LETI – Direction de la Recherche Technologique 2012.

Korytár, D., Ferrari, C., Bochníček, Z., : X-ray multiple-beam analysis in high-resolution diffractometry of III-V heterostructures J. Applied Crystall. 31 (1998) 570.

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Ferrari, C., Korytár, D., Kumar, J., : Study of residual strains in wafer crystal by means of lattice tilt mapping Il Nuovo Cimento D 19 (1997) 165.

1. Moore, C.D.: Mater. Sci Engn. B 66 (1999) 11.
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Attolini, G., Bocchi, C., Franzosi, P., Korytár, D., Pelosi, C., : X-ray diffraction study of the lattice strain relaxation in MO VPE GaAs/Ge heterostructures J. Phys. D 28 (1995) A129.

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Korytár, D., Hrivnák, M., : Experimental and computer similated mahyoh images of semiconductor wafers, Japan. J. Applied Phys. 32 (1993) 693. (Not IEE SAS).

      1. Szabo, J.: Japan J. Applied Phys. 35 (1996) L258.
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Priecel, I., Ďuríček, L., Daniška, V., Korytár, D., : Improvement of implanted layer properties of semi-insulating GaAs by ingot annealing, J. Crystal Growth 126 (1993) 103. (Not IEE SAS).

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