Ing. JÁn ŠOLTÝS, PhD.

  • 2021

Vetrova, Iu.V., Zelent, M., Šoltýs, J., Gubanov, V.A., Sadovnikov, A.V., Ščepka, T., Dérer, J., Stoklas, R., Cambel, V., and Mruczkiewicz, M.: Investigation of self-nucleated skyrmion states in the ferromagnetic/nonmagnetic multilayer dot, Applied Phys. Lett. 118 (2021) 212409.

Kityk, A., Protsenko, V., Danilov, F.I., Pavlík, V, Hnatko, M, and Šoltýs, J.:  Enhancement of the surface characteristics of Ti-based biomedical alloy by electropolishing in environmentally friendly deep eutectic solvent (Ethaline), Colloids Surfaces A 613 (2021) 126125.

Marcin, M., Pribulová, Z., Kačmarčík, J., Medvecká, Z., Klein, T., Verchenko, V.Yu., Cambel, V., Šoltýs, J., and Samuely, P.: One or two gaps in Mo8Ga41 superconductor? Local Hall-probe magnetometry study, Supercond. Sci Technol. 34 (2021) 035017.

  • 2020

Šoltýs, J., Feilhauer, J., Vetrova, J., Tóbik, J., Bublikov, K., Ščepka, T., Fedor, J., Dérer, J., and Cambel, V.: Magnetic-field imaging using vortex-core MFM tip, Applied Phys. Lett. 116 (2020) 242406.

Marcin, M., Pribulová, Z., Kačmarčík, J., Verchenko, V.Yu., Shevelkov, A.V., Cambel, V., Šoltýs, J., and Samuely, P.: Local magnetometry of superconducting Mo8Ga41 and Mo7VGa41: vortex pinning study, Acta Phys. Polonica A 137 (2020) 794-796.

  • 2018

Kúdela, R., Šoltýs, J., Kučera, M., Stoklas, R., Gucmann, F., Blaho, J., Mičušík, M., Pohorelec, O., Gregor, M., Brytavskyi, I.V., Dobročka, E., and Gregušová, D.: Technology and application of in-situ AlOx layers on III-V semiconductors, Applied Surface Sci 461 (2018) 33-38.

Szívós, J., Pothorszky, S., Šoltýs, J., Serényi, M., An, H., Gao, T., Deák, A., Shi, J., and Sáfrán, G.: CoPt/TiN films nanopatterned by RF plasma etching towards dot-patterned magnetic media, Applied Surface Sci 435 (2018) 31-38.

Šoltýs, J., Precner, M., Fedor, J., and Cambel, V.: Tailored SPM probes for dual-tip force microscopy. In: NANOCON 2017. Brno: Tanger Ltd., 2018, p. 759-764. ISBN 978-8-0872-9481-9.

  • 2017

Neilinger (Sečianska), K., Šoltýs, J., Mruczkiewicz, M., Dérer, J., Cambel, V., : Dual-cantilever magnetometer for study of magnetic interactions between patterned permalloy microstructures. J. Magnetism Magnetic Mater. 444 (2017) 354-360.

Pribulová, Z., Medvecká, Z., Kačmarčík, J., Komanický, V., Klein, T., Rodière, P., Levy-Bertrand, F., Michon, B., Marcenat, C., Barančeková Husaníková, P., Cambel, V., Šoltýs, J., Karapetrov, G., Borisenko, S., Evtushinsky, D., Berger, H., Samuely, P., : Magnetic and thermodynamic properties of CuxTiSe2 single crystals. Phys. Rev. B 95 (2017) 174512.

Neilinger (Sečianska), K., Šoltýs, J., Cambel, V., : Study of magnetic micro-ellipses by cantilever sensor. Acta Phys. Polonica A 131 (2017) 833-836.

  • 2016

Neilinger (Sečianska), K., Šoltýs, J., Truchly, M., Dérer, J., Cambel, V., : Fabrication of double cantilever sensor for study of magnetic microstructures. In: Proc. 22th Inter. Conf. on Applied Phys. of Cond. Matter (APCOM 2016). Eds. J. Vajda and I. Jamnický. Bratislava: FEI STU 2016. ISBN 978-80-227-4572-7. P. 61-64.

Medvecká, Z., Klein, T., Cambel, V., Šoltýs, J., Karapetrov, G., Levy-Bertrand, F., Michon, B., Marcenat, C., Pribulová, Z., Samuely, P., : Observation of a transverse Meissner effect in CuxTiSe2 single crystals. Phys. Rev. B 93 (2016) 100501(R).

Blaho, M., Gregušová, D., Haščík, Š., Seifertová, A., Ťapajna, M., Šoltýs, J., Šatka, A., Nagy, L., Chvála, A., Marek, J., Priesol, J., Kuzmík, J., : Post-deposition annealing and thermal stability of integrated self-aligned E/D-mode n++GaN/InAlN/AlN/GaN MOS HEMTs In: ASDAM 2016. Eds. Š. Haščík et al. IEEE 2016. ISBN 978-1-5090-3081-1. P. 177-180.

Kačmarčík, J., Pribulová, Z., Samuely, T., Szabó, P., Cambel, V., Šoltýs, J., Herrera, E., Suderow, H., Correa-Orellana, A., Prabhakaran, D., Samuely, P., : Single-gap superconductivity in ẞ-Bi2Pd. Phys. Rev. B 93 (2016) 144502.

Blaho, M., Gregušová, D., Haščík, Š., Seifertová, A., Ťapajna, M., Šoltýs, J., Šatka, A., Nagy, L., Chvála, A., Marek, J., Carlin, J., Grandjean, N., Konstantinidis, G., Kuzmík, J., : Technology of integrated self-aligned E/D-mode n++GaN/InAlN/AlN/GaN MOS HEMTs for mixed-signal electronics. Semicond. Sci Technol. 31 (2016) 065011.

  • 2015

Neilinger (Sečianska), K., Šoltýs, J., Tóbik, J., Dérer, J., Cambel, V., : Cantilever sensor for study of magnetic microstructures In: Proc. 21th Inter. Conf. on Applied Phys. of Cond. Matter (APCOM 2015). Eds. J. Vajda and I. Jamnický. Bratislava: FEI STU 2015. ISBN 978-80-227-4373-0. P. 189-193.

Precner, M., Fedor, J., Šoltýs, J., Cambel, V., : Dual-tip magnetic force microscopy with suppressed influence on magnetically soft samples. Nanotechnol. 26 (2015) 055304.

Ščepka, T., Polakovič, T., Šoltýs, J., Tóbik, J., Kulich, M., Kúdela, R., Dérer, J., Cambel, V., : Individual vortex nucleation/annihilation in ferromagnetic nanodots with broken symmetry observed by micro/Hall magnetometry. AIP Adv. 5 (2015) 117205.

Kúdela, R., Gregušová, D., Šoltýs, J., Kučera, M., Dobročka, E., : Technology and application of in-situ alox layers on III-V semiconductors. In: Progress in Applied Surface, Interface and Thin Film Sci. 2015 – SURFINT-SREN IV. Extend. Abstract Book. Ed. R. Brunner. Bratislava: CU 2015. ISBN: 978-80-223-3975-9. P. 87-88.

  • 2014

Štrbik, V., Reiffers, M., Dobročka, E., Šoltýs, J., Španková, M., Chromik, Š., : Epitaxial LSMO thin films with correlation of electrical and magnetic properties above 400K. Applied Surface Sci 312 (2014) 212-215.

Precner, M., Fedor, J., Tóbik, J., Šoltýs, J., Cambel, V., : High resolution tips for switching magnetization MFM. Acta Phys. Polonica A 126 (2014) 386-387.

Pribulová, Z., Medvecká, Z., Kačmarčík, J., Komanický, V., Klein, T., Barančeková Husaníková, P., Cambel, V.,Šoltýs, J., Karapetrov, G., Samuely, P., : Local magnetometry of Cu0,064TiSe2. Acta Phys. Polonica A 126 (2014) 370-371.

Barančeková Husaníková, P., Cambel, V., Fedor, J., Šoltýs, J., Karapetrov, G., : Magnetization studies of Cu0.058TiSe2 near a quantum critical point. Acta Phys. Polonica A 126 (2014) 336-337.

Ščepka, T., Šoltýs, J., Precner, M., Fedor, J., Tóbik, J., Gregušová, D., Gucmann, F., Kúdela, R., Cambel, V., : Vortex dynamics in ferromagnetic nanoelements observed by micro-hall probes. Acta Phys. Polonica A 126 (2014) 390-391.

  • 2013

Huran, J., Balalykin, N., Hotový, I., Šoltýs, J., Feshchenko, A., Haščík, Š., : GaAs mesh type transmission photocathode prepared by inductively oupled plasma CCl2F2 etching of GaAs substrate. In: Proc. ADEPT. 1st Inter. Conf. on Advan. in Electronic and Photonic Technol. Eds. D. Pudis et al. Žilina: Univ. Žilina 2013. ISBN 978-80-554-0689-3. P. 233-236.

Cambel, V., Precner, M., Fedor, J., Šoltýs, J., Tóbik, J., Ščepka, T., Karapetrov, G., : High resolution switching magnetization magnetic force microscopy. Applied Phys. Lett. 102 (2013) 062405.

Hudec, B., Hušeková, K., Rosová, A., Šoltýs, J., Rammula, R., Kasikov, A., Uustare, T., Mičušík, M., Omastová, M., Aarik, J., Fröhlich, K., : Impact of plasma treatment on electrical properties of TiO2/RuO2 based DRAM capacitor. J. Phys. D 46 (2013) 385304.

Šoltýs, J., Gaži, Š., Fedor, J., Tóbik, J., Precner, M., Cambel, V., : Magnetic nanostructures for non-volatile memories. Microelectr. Engn. 110 (2013) 474-478.

Barančeková Husaníková, P., Fedor, J., Dérer, J., Šoltýs, J., Cambel, V., Iavarone, M., May, S., Karapetrov, G., : Magnetization properties and vortex phase diagram of CuxTiSe2 single crystals. Phys. Rev. B 88 (2013) 174501.

Kúdela, R., Šoltýs, J., Vincze, A., Novák, J., : Tellurium delta-doped InGaP layers grown by metalorganic vapour phase epitaxy. Phys. Status Solidi RRL 7 (2013) 443–446.

Cambel, V., Tóbik, J., Šoltýs, J., Fedor, J., Precner, M., Gaži, Š., Karapetrov, G., : The influence of shape anisotropy on vortex nucleation in Pacman-like nanomagnets,. J. Magnetism Magnetic Mater. 336 (2013) 29-36.

Hasenöhrl, S., Eliáš, P., Šoltýs, J., Stoklas, R., Laurenčíková, A., Novák, J., : Zinc-doped gallium phosphide nanowires for photovoltaic structures,. Applied Surface Sci 269 (2013) 72-76.

  • 2012

Meško, M., Vretenár, V., Kotrusz, P., Hulman, M., Šoltýs, J., Skákalová, V., : Carbon nanowalls synthesis by means of atmospheric dcPECVD method. Phys. Status Solidi B 249 (2012) 2625–2628.

Ščepka, T., Gregušová, D., Gaži, Š., Haščík, Š., Fedor, J., Šoltýs, J., Kúdela, R., Cambel, V., : Detection elements for on-cantilever laboratory. In: ASDAM 2012. Eds. Š. Haščík, J. Osvald. Piscataway: IEEE 2012. ISBN 978-1-4673-1195-3. P. 91-94.

Novák, J., Šoltýs, J., Eliáš, P., Hasenöhrl, S., Stoklas, R., Laurenčíková, A., Mikulics, M., : Electrical and photoluminescence properties of individual GaP nanowires doped by zinc Phys. Status Solidi a 209 (2012) 2505-2509.

Precner, M., Gregušová, D., Šoltýs, J., Fedor, J., Gucmann, F., Tóbik, J., Kúdela, R., Cambel, V., : Nucleation and annihilation of magnetic vortices in Pacman-like nanodots observed by micro-Hall probes. In: ASDAM 2012. Eds. Š. Haščík, J. Osvald. Piscataway: IEEE 2012. ISBN 978-1-4673-1195-3. P. 87-90.

  • 2011

Hasenöhrl, S., Novák, J., Vávra, I., Šoltýs, J., Kučera, M., Šatka, A., : Epitaxial growth of GaP/InxGa1-xP (xIn ≥ 0,27) virtual substrate for optoelectronic applications, J. Electr. Engn. 62 (2011) 93-98.

Šoltýs, J., Kúdela, R., Kučera, M., Eliáš, P., Novák, J., Cambel, V., Vávra, I., Kostič, I., : Characterization of an AlGaAs/GaAs quantum well prepared on objects of pyramidal shape. J. Crystal Growth 316 (2011) 67-70.

Eliáš, P., Kostič, I., Šoltýs, J., : Patterning of pyramidal recesses in (1 0 0)InP substrate. Microelectr. Engn. 88 (2011) 36-40.

Cambel, V., Šoltýs, J., : Skenovacie mikroskpie. In: Kryofyzika a nanoelektronika. Košice: ÚEF SAV, 2011. ISBN 978-80-968060-9-6. S. 269-305.

  • 2010

Novák, J., Vávra, I., Križanová, Z., Hasenöhrl, S., Šoltýs, J., Reiffers, M., Štrichovanec, P., : Dependence of Curie temperature on surface strain in InMnAs epitaxial structures. Applied Surface Sci 256 (2010) 5672-5675.

Telek, P., Hasenöhrl, S., Šoltýs, J., Vávra, I., Držík, M., Novák, J., : Design, preparation and properties of spin-LED structures based on InMnAs. In: ASDAM ’10. Ed. J. Breza et al. Piscataway: IEEE 2010. ISBN: 978-1-4244-8572-7. P. 175-178.

Gregušová, D., Kúdela, R., Eliáš, P., Šoltýs, J., Kostič, I., Cambel, V., : GaAs/AlAs/InGaP heterostructure: a versatile material basis for cantilever designs. J. Micromech. Microeng. 20 (2010) 097001.

Hušeková, K., Dobročka, E., Rosová, A., Šoltýs, J., Šatka, A., Fillot, F., Fröhlich, K., : Growth of RuO2 thin films by liquid injection atomic layer deposition. Thin Solid Films 518 (2010) 4701-4704.

Čičo, K., Gregušová, D., Gaži, Š., Šoltýs, J., Kuzmík, J., Carlin, J., Grandjean, N., Pogany, D., Fröhlich, K., : Optimization of the ohmic contact processing in InAlN/GaN high electron mobility transistors for lower temprerature of annealing, Phys. Status Solidi c 7 (2010) 108-111.

Novák, J., Šoltýs, J., Eliáš, P., Hasenöhrl, S., Vávra, I., : Study of the growth and structural properties of InMnAs dots grown on high-index surfaces by MOVPE. Mater. Sci Semicond. Proc. 13 (2010) 167-172.

  • 2009

Kúdela, R., Kučera, M., Dobročka, E., Šoltýs, J., : AlGaAs/InGaP interfaces in structures prepared by MOVPE. J. Crystal Growth 311 (2009) 3123-3129.

Novák, J., Vávra, I., Šoltýs, J., Hasenöhrl, S., Reiffers, M., Štrichovanec, P., : Effect of nanodimension on the properties of III-V ferromagnetic semiconductors. In: Proc. 17th Conf. Slovak Physicists. Ed. M. Reiffers. Bratislava: Slovak Phys. Soc., 2009. ISBN 978-80-969124-7-6. P. 13-16.

Kúdela, R., Gregušová, D., Stoklas, R., Šoltýs, J., Kučera, M., Dobročka, E., Kordoš, P., : HEMT transistors with aluminum oxide and InGaP layers. In: EW-MOVPE XIII. Ulm Univ. 2009. P. 225-228.

  • 2008

Novák, J., Vávra, I., Hasenöhrl, S., Šoltýs, J., Štrichovanec, P., Balazsi, K., : Influence of GaAs cap layer on the relaxation of InMnAs dots. In: APCOM 2008. Eds. J. Vajda et al. Bratislava: FEI STU, 2008. P. 171-174.

Novák, J., Eliáš, P., Šoltýs, J., Hasenöhrl, S., Vávra, I., : InMnAs dots grown on GaAs surfaces etched via AlAs sacrificial layer. In: ASDAM 2008. Eds. Š. Haščík and J.Osvald. Piscataway: IEEE 2008. ISBN: 978-1-4244-2325-5. P. 219-222.

Cambel, V., Martaus, J., Šoltýs, J., Kúdela, R., Gregušová, D., : Local anodic oxidation by AFM tip developed for novel semiconductor nanodevices. Ultramicroscopy 108 (2008) 1021-1024.

Martaus, J., Gregušová, D., Cambel, V., Kúdela, R., Šoltýs, J., : New approach to local anodic oxidation of semiconductor heterostructures. Ultramicroscopy 108 (2008) 1086-1089.

Cambel, V., Šoltýs, J., : Skenovacia sondová mikroskpia vo výskume povrchov materiálov. In: Rozprávanie o materiáloch. Bratislava: ÚMMS SAV, 2008. ISBN 978-80-970027-6-3. S. 81-92.

  • 2007

Cambel, V., Martaus, J., Šoltýs, J., Kúdela, R., Gregušová, D., : AFM nanooxidation process – technology perspective for mesoscopic structures. Surface Sci. 601 (2007) 2717-2723.

Martaus, J., Gregušová, D., Cambel, V., Kúdela, R., Šoltýs, J., : AFM tip induced local anodic oxidation of InGaP/AlGaAs/GaAs heterostructures. In: EW-MOVPE XII: extended abstracts. Bratislava: IEE SAS, 2007. P. 299-302.

Bartolome, E., Pavau, A., Guitierrez, J., Granados, X., Pomar, A., Puig, T., Obradors, X., Cambel, V., Šoltýs, J., Gregušová, D., Chen, D., Sanchez, A., : Artificial magnetic granularity effects on patterned epitaxial YBa2Cu3O7-x thin films. Phys. Rev. B 76 (2007) 094508.

Štrichovanec, P., Kúdela, R., Vávra, I., Kováč, J., Šoltýs, J., Novák, J., : Characterization of corrugated MQW heterostructure prepared on patterned (001) GaAs substrate by MOVPE Physica Status Solidi c 4 (2007) 1499-1502.

Cambel, V., Karapetrov, G., Novosad, V., Bartolome, E., Gregušová, D., Fedor, J., Kúdela, R., Šoltýs, J., :Novel Hall sensors developed for magnetic field imaging systems. J. Magnetism Magn. Mater. 316 (2007) 232-235.

Šoltýs, J., Cambel, V., Kúdela, R., Eliáš, P., : Study into the shape of oxide lines formed by LAO – influence an oxidized material. Surface Sci 601 (2007) 2876-2880.

Šoltýs, J., Gregušová, D., Kúdela, R., Kostič, I., Cambel, V., : Study of epitaxially overgrown pyramids developed for active tips in scanning force microscopy. In: EW-MOVPE XII: extended abstracts. Bratislava: IEE SAS, 2007. P. 297-298.

Eliáš, P., Šoltýs, J., Kostič, I., : Study of ordinary facets revealed in (100) InP by etching in HCl. Mater. Sci Engn. B 138 (2007) 172-179. (APVV 51-045705).

Cambel, V., Šoltýs, J., : The influence of sample conductivity on local anodic oxidation by the tip of atomic force microscope. J. Applied Phys. 102 (2007) 074315. (APVV 51-045705).

  • 2006

Martaus, J., Cambel, V., Kúdela, R., Gregušová, D., Šoltýs, J., : 2D electron transport through potential barrier prepared by LAO on shallow GaAs/AlxGa1-xAs/InGaP heterostructures. In: ASDAM 2006. Eds. J. Breza et al. Piscataway: IEEE 2006. ISBN: 1-4244-0396-0. P. 253-256.

Haščík, Š., Eliáš, P., Šoltýs, J., Martaus, J., Hotový, I., : CCl4-based reactive ion etching of semi-insulating GaAs and InP. Czechoslov. J. Phys. B 56 (2006) S1169-S1173.

Eliáš, P., Haščík, Š., Martaus, J., Kostič, I., Šoltýs, J., Hotový, I., : CCl4-based RIE pattern transfer into facets of mesas formed by wet etching in InP(100). Electrochem. Solid-State Lett. 9 (2006) G27-G30.

Šoltýs, J., Gregušová, D., Kúdela, R., Šatka, A., Kostič, I., Cambel, V., : Formation of sharp-apex pyramids for active tips used in scanning probe microscopy. In: ASDAM 2006. Eds. J. Breza. et al. Piscataway: IEEE 2006. ISBN: 1-4244-0396-0. P. 105-108.

Cambel, V., Šoltýs, J., Martaus, J., Moško, M., : IV characteristics in structures prepared by tip induced oxidation J. de Physique IV 132 (2006) 171-175.

Gregušová, D., Eliáš, P., Öszi, Z., Kúdela, R., Šoltýs, J., Fedor, J., Cambel, V., Kostič, I., : Technology and properties of a vector hall sensor. Microelectronics J. 37 (2006) 1543-1546.

  • 2005

Eliáš, P., Martaus, J., Šoltýs, J., Kostič, I., : Micromachining of mesa and pyramidal-shaped objects in (1 0 0) InP substrates. J. Micromech. Microengn. 15 (2005) 1007-1014.

Štrichovanec, P., Novák, J., Vávra, I., Kúdela, R., Kučera, M., Šoltýs, J., : QWIP structures prepared on wet-etched non-planar GaAs. Phys. Status Solidi c 2 (2005) 1384-1388.

Španková, M., Vávra, I., Chromik, Š., Harasek, S., Lupták, R., Šoltýs, J., Hušeková, K., : Structural properties of Y2O3 thin films grown on Si(1 0 0) and Si(1 1 1) substrates,. Materials Sci Engn. B 116 (2005) 30-33.

  • 2004

Eliáš, P., Šoltýs, J., Kostič, I., : Formation of micro- and nano-striations at (211)A facets during wet etching of InP in HCl. Superlatt. Microstruct. 36 (2004) 315-323.

Písečný, P., Hušeková, K., Fröhlich, K., Harmatha, L., Šoltýs, J., Machajdík, D., Espinos, J., Jergel, M., Jakabovič, J., : Growth of lanthanum oxide films for application as a gate dielectric in CMOS technology. Materials Sci Semicond. Process. 7 (2004) 231-236.

Novák, J., Hasenöhrl, S., Kučera, M., Šoltýs, J., : Nano-patterning surfaces by the self-organized growth of ordered and strained epitaxial layers. Superlatt. Microstruct. 36 (2004) 123-131.

Gregušová, D., Novák, J., Hardtdegen, H., Šoltýs, J., Kostič, I., Greguš, J., : Smooth GaN recess wet photoelectrochemical etching. In: ASDAM 2004. Eds. J.Osvald and Š.Haščík. Piscataway: IEEE 2004. ISBN 0-7803-8535-7. P. 199-202.

Cambel, V., Šoltýs, J., Moško, M., Kúdela, R., : Two-dimensional electron transport through a barrier prepared by tip-induced oxidation. Superlatt. Microstruct. 36 (2004) 359-367.

Eliáš, P., Kostič, I., Šoltýs, J., Hasenöhrl, S., : Wet-etch bulk micromachining of (100) InP substrates. J. Micromech. Microengn. 14 (2004) 1205–1214.

  • 2003

Gregušová, D., Cambel, V., Fedor, J., Kúdela, R., Šoltýs, J., Lalinský, T., Kostič, I., Bending, S., : Fabrication of a vector Hall sensor for magnetic microscopy. Applied Phys. Lett. 82 (2003) 3704-3706.

Gregušová, D., Cambel, V., Kúdela, R., Šoltýs, J., Kostič, I., Attolini, G., Pelosi, C., : Investigation of the GaAs-pyramids overgrowth using MOCVD. J. Crystal Growth 248 (2003) 417-420.

Kúdela, R., Štrichovanec, P., Gregušová, D., Cambel, V., Šoltýs, J., Hasenöhrl, S., Novák, J., Kostič, I., Attolini, G., Pelosi, C., : MOVPE growth of AlGaAs/GaAs and InGaP/GaAs structures on patterned GaAs substrates. In: EW MOVPE X. Univ. Lecce 2003. P. 219.

Šoltýs, J., Cambel, V., Fedor, J., : Study of tip-induced Ti-film oxidation in atomic force microscopy contact and non-contact mode Acta Physica Polonica A 103 (2003) 553-558.